Molecular spectroscopy for metallurgists. Fundamentals and application
Lecturer: dr hab. Edyta Proniewicz, prof. AGH
The scope of material:
- Spectroscopy basis
- Rotational spectroscopy
- Vibrational spectroscopy (Raman and IR)
- X-ray photoelectron spectroscopy (XPS)
- Auger electron spectroscopy (AES)
- Secondary ion mass specrtoscopy (SIMS)
- Ion scattering spectroscopy (ISS)
- LEIS - low energy (keV)
- RBS - high energy (MeV), Rutherford back-scattering spectroscopy
- Particle induced X-ray emission (PIXE) analysis
Students are obliged to prepare presentation on the topic chosen from the list below:
- Application of Raman spectroscopy...
- Application of absorption infrared spectroscopy...
- Application of X-ray photoelectron spectroscopy...
- Application of Auger electron spectroscopy...
- Application of secondary ion mass spectroscopy...
- Application of low-energy ion scattering spectroscopy...
- Application of Rutherford back-scattering spectroscopy...
- Application of particle induced X-ray emission analysis...
- Investigation of metal containing art objects by molecular spectroscopy methods.
- Surface analysis of alloys.
- Investigation of corrosion by molecular spectroscopy methods.
- Steel in the light of molecular spectroscopy methods.
...to study the metal-containing compounds, metal surfaces, metal coating layers, steel and alloys.
Bibliography:
- J. Michael Hollas, Modern Spectroscopy, John Wiley & Sons.
- Z. Kęcki, Podstawy spektroskopii molekularnej, PWN.
- D. Briggs, M. P. Seah (Eds.), Practical surface analysis, John Wiley & Sons.
- Challa S. S. R. Kumar (Eds.), Surface science tools for nanomaterials characterization, Springer-Verlag.
- R. J. H. Clark, R. E. Hester. (Eds.), Spectroscopy of surfaces, John Wiley & Sons.
- J. L. Gallardo, M. C. Colin, Surface Spectroscopy:For Engineers and Scientists, CreateSpace Independent Publishing Platform.